EMC/EMI Seminar ARUK & Keysight

We are pleased to invite you to join us for a seminar hosted by our Solution Partner Keysight and Y.I.C. Technologies.

“EMC Tips and Solutions to help engineers troubleshoot those tricky EMC challenges”

Date: Thursday 22nd June 2023
Location: Keysight Office, 610 Wharfedale Rd, Winnersh, Wokingham, RG41 5TP
Synopsis of Presentations:
AR – David Feltbower
EMC Immunity Multi-Tone Testing, Theory, and Practice Multi-tone testing has many benefits.

While the multi-tone method was initially implemented to increase the speed of IEC 61000-4-3 radiated immunity testing, it has been found that this method also improves equipment efficiency, offers greater flexibility to truly test the equipment (EUT) under real-world threat conditions, and can be fully compliant to standards.

Other benefits include more efficient use of finite financial and human resources and faster time-to-market for new and enhanced products.

Keysight Technologies – Callum Williams
How to perform pre-compliance EMC measurements with a spectrum analyser

A spectrum analyzer with built-in CISPR and MIL-STD compliant bandwidths, detectors and automated testing to regulatory Limit Lines with user-selected margins can save you a valuable amount of time and money in testing your product for EMC emissions before they go through a full compliance testing in a certified lab.

Keysight’s Solution Expert will guide you through the steps taken: Scan, Search and Measure, to perform a practical pre-compliance EMC measurement using a spectrum analyzer.

Y.I.C. Technologies – Arturo Mediano
Exploring EMC/EMI Issues with Real-Time Scanning Techniques

During this presentation we will explore the high-speed PCBs design challenges one typically finds at the EMI/EMC level. We will use a set of electronic PCB boards to demonstrate some of the most classic problems PCB designers might implement in a new PCB design.

10 Simple circuits have been designed to demonstrate issues that can be detected and illustrated by the use of a Spectrum Analyzer, Near Field Probes and Near Field scanner.

Each circuit will provide an in-dept analysis that relates to a specific EMC/EMI key design fault.

During the live session we will explore the following issues:

  • IC Decoupling
  • Crosstalk at the component level
  • Shielding Leakage
  • Effect of Ferrite in signal paths
  • Slots in ground planes
  • Trace on Boards edge
  • Controlling current path
  • How layout change filter behaviour
  • Near Field Communication (NFC) and more

MVG – Paul Duxbury
Design Issues and Considerations when Planning a Shielded Chamber

When you are looking to install a shielded chamber, there are several aspects which you need to take into account, depending on what the chamber will be used for, and the size of the chamber.

During this presentation we will review some of these, and provide some guidance on the areas which you, as the user of the chamber, need to consider when starting to plan the installation of a new chamber.

We will also consider areas which we, as the chamber supplier, can assist with and provide design input on for you.